This Journal contains the technical papers and presentations from the Fall International Conference held at the Shangri-La Hotel, Toronto, Canada
The Influence of Byproducts on Etching Metals with Ferric Chloride Etchant
David Allen | Emeritus Professor | Cranfield University | UK
Inkjettable Etch Resists
Krishna Balantrapu | Senior Chemist | Dow Chemical Company | US
Wastewater Recycling Technologies
Tom Belmont | Owner | LT Technologies | US
Process Issues | Cleaning, Coating and Imaging
Bill Wilson | SR. Technical Specialist | DuPont Electronics & Communications | US
The Fundamentals of Photochemcmial Machining
David Allen | Emeritus Professor | Cranfield University | UK
BarCode Reading
Anton Sawatzky | BC Sales Engineer |Cognex Corporation | CA
How Multisensor Metrology Cuts Manufacturing Costs
Tom Groff | North American Sales Manager | Optical Gaging Products (OGP) | CA
Electrochemical Etching for Micro- and Nano-Structuring
Dr. Monika Saumer |University of Applied Sciences | DE
Automated Measuring and Inspection
Andrew Craig | Instant Measurement Specialist | Keyence Canada | CA
A Look Back | Industry Trends Analysis
Phil Grenier | Tooling Manager Photofabrication Engineering, Inc. | US
Metals for the PCM Process
Andrew Mays | Product Manager | Ulbrich Stainless Steel & Special Metals | US
Enterprise Software Planning Systems
Shawn Coultice |Territory Manager | Shoptech Industrial Software | US
Promoting PCM | Locally | Nationally | Internationally
Group Discussion
