Journal Winter 2015

This Journal contains the technical papers and presentations from the Fall International Conference held at the Shangri-La Hotel, Toronto, Canada

The Influence of Byproducts on Etching Metals with Ferric Chloride Etchant
David Allen | Emeritus Professor | Cranfield  University | UK

Inkjettable Etch Resists
Krishna Balantrapu | Senior Chemist | Dow Chemical Company | US

Wastewater Recycling Technologies
Tom Belmont | Owner | LT Technologies | US

Process Issues | Cleaning, Coating and Imaging
Bill Wilson  | SR. Technical Specialist | DuPont Electronics & Communications | US

The Fundamentals of Photochemcmial Machining 
David Allen | Emeritus Professor | Cranfield  University | UK

BarCode Reading
Anton Sawatzky | BC Sales Engineer |Cognex Corporation | CA

How Multisensor Metrology Cuts Manufacturing Costs
Tom Groff | North American Sales Manager | Optical Gaging Products (OGP) | CA

Electrochemical Etching for Micro- and Nano-Structuring
Dr. Monika Saumer |University of Applied Sciences |  DE

Automated Measuring and Inspection
Andrew Craig | Instant Measurement Specialist  | Keyence Canada | CA

A Look Back | Industry Trends Analysis
Phil Grenier | Tooling Manager Photofabrication Engineering, Inc.  | US

Metals for the PCM Process
Andrew Mays |  Product Manager | Ulbrich Stainless Steel & Special Metals | US

Enterprise Software Planning Systems
Shawn Coultice  |Territory Manager | Shoptech Industrial Software | US

Promoting PCM | Locally | Nationally | Internationally
Group Discussion



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