
Essentials of Photochemical Machining (Parts 1-4)
“Essentials of Photochemical Machining”
presented by: David Allen, BSc, PhD, DSc, FCIRP | Emeritus Professor of Microengineering, Cranfield University, UK
- What to Expect: Part 1
- Front end for an electronics assembly etched from 0.010 in. thick AISI 316L stainless steel.
- What to Expect: Part 2
- Photoresist Development Variables and Control
- Break-point (dwell time in a conveyorized developer chamber)
- Temperature
- Chemistry
- Dry film type and thickness
- Spray pattern and pressure
- Rinsing and drying
- Photoresist Development Variables and Control
- What to Expect: Part 3
- Monitoring FeCl3 Etchants: a need to be predictive rather than reactive
- Temperature (should be constant)
- Baumé (specific gravity)
- Free-acid (HCl) content
- Oxidation-reduction potential (ORP)
- Dissolved metal content
- Additives (if applicable)
- Monitoring FeCl3 Etchants: a need to be predictive rather than reactive
- What to Expect: Part 4
- Regeneration with sodium chlorate – Often referred to as the BEAC (Balanced Etchant Analysis
Controller) process.
- Regeneration with sodium chlorate – Often referred to as the BEAC (Balanced Etchant Analysis
$2,000.00










